Standard

JEDEC JESD28-A

Published

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Abstract

This document describes an accelerated test for measuring the hot-carrier-induced degradation of a single n-channel MOSFET using dc bias. The purpose of this document is to specify a minimum set of measurements so that valid comparisons can be made between different technologies, IC processes, and process variations in a simple, consistent and controlled way. The measurements specified should be viewed as a starting point in the characterization and benchmarking of the transistor manufacturing process.

Document information

  • Standard from JEDEC_AC
  • Published:
  • Version: 0
  • Document type: IS