Standard

JEDEC JESD24-3

Published

Note: This standard has a new edition: JEDEC JESD24-3

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Abstract

The purpose of this test method is to measure the thermal impedance of the MOSFET under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity if the forward voltage drop of the source-drain is used as the junction temperature indicator. This method is particularly suitable to enhancement mode, power MOSFETs having relatively long thermal response times. This test method may be used to measure the thermal response of junction to a heating pulse, to ensure proper die mountdown to its case, or the dc thermal resistance, by the proper choice of the pulse duration and magnitude if the heating pulse. 

Document information

  • Standard from JEDEC_AC
  • Published:
  • Version: 0
  • Document type: IS
  • Additional information
    • Addendum to JEDEC JESD 24