Standard

IEC PAS 62189:2000 ED1

Nov 2000 Replaced

Corrigendums and amendments are bought separately.

Language English

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Abstract

This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.

Document information

Standard from IEC
Published: 28 November 2000
Withdrawn: 23 February 2004
Edition: 1
Version: 1
Document type: PAS
ISBN: 2831854679

ICS 31.080.01
ISO TC TC 47

Product Relations

Replaced by: IEC 60749-23:2004+AMD1:2011 CSV
Replaced by: IEC 60749-23:2004 ED1
Adopted by: NEK ISO/IEC 15955:1999

Product life cycle

Current product

Replaced

IEC PAS 62189:2000 ED1
Stage 99.60
Replaced by

Revised

IEC 60749-23:2004+AMD1:2011 CSV

Revised

IEC 60749-23:2004 ED1

IEC PAS 62189:2000 ED1

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Abstract

Document information

Product Relations

Product life cycle

Access to standards for the entire organization

Benefits of our business solution:

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Extended editions Extended editions (0)

Version history Related corrigendum and amendments (0)

Abstract

Document information

Product Relations

Product life cycle