Standard

IEC 61163-1:2006 ED2

Jun 2006 Published

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Abstract

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

Document information

Standard from IEC
Published: 26 June 2006
Edition: 2
Version: 1
Document type: IS
Pages
ISBN:

ICS 03.120.01
ICS 03.120.30
ICS 21.020
ISO TC TC 56

Product Relations

Adopted by: NEK CISPR 16-2-2:2003
Partially replaces: IEC 60300-3-7:1999 ED1
Revises: IEC 61163-1:1995 ED1

IEC 61163-1:2006 ED2

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