Standard

IEC 61163-1:1995 ED1

Aug 1995 Revised

Note: This standard has a new edition: IEC 61163-1:2006 ED2

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Corrigendum 1 - Reliability stress screening - Part 1: Repairable items manufactured in lots Revised IEC 61163-1:1995/COR1:1999 ED1 Corrigendum from Publication date: Dec 1999 Version: 1 Language: English/French Services: Read Online (No printing ), Printed and bound

Abstract

These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

Document information

Standard from IEC
Published: 14 August 1995
Withdrawn: 26 June 2006
Edition: 1
Version: 1
Document type: IS
Pages
ISBN: 2831834864

ICS 03.120.01
ICS 03.120.30
ICS 21.020
ISO TC TC 56

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Revised by: IEC 61163-1:2006 ED2

IEC 61163-1:1995 ED1

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IEC 61163-1:2006 ED2