Consolidated

IEC 60749-32:2002+AMD1:2010 CSV

Nov 2010 Published

Corrigendums and amendments are bought separately.

Language English/French

Services Read Online (No printing ) kr 798,00 Printed and bound Delivery time: 5-10 days kr 997,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.

Document information

Consolidated from IEC
Published: 29 November 2010
Edition: 1.1
Version: 1
Document type: IS
Pages
ISBN: 9782889122349

ICS 31.080.01
ISO TC TC 47

IEC 60749-32:2002+AMD1:2010 CSV

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer