Consolidated

IEC 60749:1996+AMD1:2000+AMD2:2001 CSV

Apr 2002 Replaced

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Document information

Consolidated from IEC
Published: 10 April 2002
Withdrawn: 21 May 2004
Edition: 2.2
Version: 1
Document type: IS
Pages
ISBN: 2831860806

ICS 31.080.01
ISO TC TC 47

Product Relations

Revises: IEC 60749:1984 ED1

IEC 60749:1996+AMD1:2000+AMD2:2001 CSV

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