Standard

NEK IEC 61967-5:2003

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Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.

Dokumentinformasjon

  • Standard fra NEK
  • Publisert:
  • Tilbaketrukket:
  • Utgave: 1.0
  • Versjon: 1
  • Varetype: NAT
  • ICS 31.200
  • National Committee NEK/NK47

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