Standard

NEK IEC 61967-5:2003

Feb 2003 Withdrawn

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Abstract

Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.

Document information

Standard from NEK
Published: 13 February 2003
Withdrawn: 11 October 2024
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.200
National Committee NEK/NK47

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Adopted from: IEC 60904-5:1993 ED1
Adopted from: IEC 61967-5:2003

NEK IEC 61967-5:2003

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Abstract

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Abstract

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