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NEK IEC 60749-30:2005+A1:2011 CSV

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Merknad: Denne standarden har en ny utgave: NEK IEC 60749-30:2020

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IEC 60749-30:2005+A1:2011 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation. These SMDs should be subjected to the appropriate preconditioning sequence described in this standard prior to being submitted to specific in-house reliability testing (qualification and/or reliability monitoring) in order to evaluate long term reliability (impacted by soldering stress). This consolidated version consists of the first edition (2005) and its amendment 1 (2011). Therefore, no need to order amendment in addition to this publication.

Dokumentinformasjon

  • Konsolidert fra NEK
  • Publisert:
  • Tilbaketrukket:
  • Utgave: 1.1
  • Versjon: 1
  • Varetype: NAT
  • Products.Specs.pages
  • ICS 31.080.01
  • National Committee NEK/NK47

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