Handlevagon 0
Standard

NEK IEC 60749-3:2017

Publisert

Merknad: Denne standarden har en ny utgave: NEK IEC 60749-3:2017

Forhåndsvisning

Rettelser og tillegg kjøpes separat.

Språk
Tjenester

Omfang

IEC 60749-3:2017 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance. This edition includes the following significant technical changes with respect to the previous edition: a) reference to the need for ESD protection; b) inclusion of information on the phenomenon of tin whiskers; c) inclusion of an optional report form/checklist.

Dokumentinformasjon

  • Standard fra NEK
  • Publisert:
  • Utgave: 2.0
  • Versjon: 1
  • Varetype: NAT
  • Products.Specs.pages
  • ICS 31.080.01
  • National Committee NEK/NK47

Produktrelasjon