Standard

NEK EN 60749-13:2002

Tilbaketrukket

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Omfang

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Dokumentinformasjon

  • Standard fra NEK
  • Publisert:
  • Tilbaketrukket:
  • Utgave: 2002-08
  • Versjon: 1
  • Varetype: NAT
  • ICS 31.080.01
  • National Committee NEK/NK47

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