Standard

NEK EN 60749-13:2002

Aug 2002 Withdrawn

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Abstract

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Document information

Standard from NEK
Published: 16 August 2002
Withdrawn: 22 March 2021
Edition: 2002-08
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

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Replaced by: NEK EN IEC 60749-13:2018
Adopted from: EN 60749-13:2002 , 0

NEK EN 60749-13:2002

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Abstract

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