Standard

JEDEC JESD22-B102E

Publisert
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Omfang

This test method provides optional conditions for preconditioning and soldering for the purpose of assessing the solderability of device package terminations. It provides procedures for dip & look solderability testing of through hole, axial and surface mount devices and a surface mount process simulation test for surface mount packages. The purpose of this test method is to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface using lead (Pb) containing or Pb-free solder for the attachment.

Dokumentinformasjon

  • Standard fra JEDEC_AC
  • Publisert:
  • Versjon: 0
  • Varetype: IS