Standard

JEDEC JESD22-B102E

Oct 2007 Published

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Abstract

This test method provides optional conditions for preconditioning and soldering for the purpose of assessing the solderability of device package terminations. It provides procedures for dip & look solderability testing of through hole, axial and surface mount devices and a surface mount process simulation test for surface mount packages. The purpose of this test method is to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface using lead (Pb) containing or Pb-free solder for the attachment.

Document information

Standard from JEDEC_AC
Published: 22 October 2007
Version: 0
Document type: IS
ISBN:

JEDEC JESD22-B102E

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Abstract

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