Standard

IEEE C62.59

Publisert
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Omfang

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: — Forward biased diodes — Zener breakdown diodes — Avalanche breakdown diodes — Punch-through diodes — Foldback diodes This standard does not cover thyristor surge protective components; see IEEE Std C62.37 [B18].1 1The numbers in brackets correspond to those of the bibliography in Annex A.

Dokumentinformasjon

  • Standard fra IEEE_AC
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  • Varetype: IS