Standard

IEEE C62.59

Published

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Abstract

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: — Forward biased diodes — Zener breakdown diodes — Avalanche breakdown diodes — Punch-through diodes — Foldback diodes This standard does not cover thyristor surge protective components; see IEEE Std C62.37 [B18].1 1The numbers in brackets correspond to those of the bibliography in Annex A.

Document information

  • Standard from IEEE_AC
  • Published:
  • Version: 0
  • Document type: IS