Standard

IEC 60749-27:2003 ED1

Revidert

Merknad: Denne standarden har en ny utgave: IEC 60749-27:2006+AMD1:2012 CSV

Forhåndsvisning

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Omfang

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the human body model (see IEC 60749-26).

Dokumentinformasjon

  • Standard fra IEC
  • Publisert:
  • Tilbaketrukket:
  • Utgave: 1
  • Versjon: 1
  • Varetype: IS
  • ICS 31.080.01
  • ISO TC TC 47

Produktrelasjon

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