Standard

IEC 60749-26:2006 ED2

Revidert

Merknad: Denne standarden har en ny utgave: IEC 60749-26:2025 ED5

Forhåndsvisning

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Omfang

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Dokumentinformasjon

  • Standard fra IEC
  • Publisert:
  • Tilbaketrukket:
  • Utgave: 2
  • Versjon: 1
  • Varetype: IS
  • ICS 31.080.01
  • ISO TC TC 47

Produktrelasjon

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