Problems with access to standards We are currently experiencing issues accessing standards in the Global Subscription, such as API, ASTM, ASME, IEEE, and others. The issue is affecting multiple services internationally, and work is underway to resolve it.
Standard

NS-EN ISO 25178-604:2025

Published
Preview

Corrigenda and amendments are bought separately.

Language
Services

Abstract

This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.

Document information

  • Standard from SN
  • Published:
  • Edition: 2025-02
  • Version: 1
  • Document type: NAT
  • ICS 17.040.20
  • National Committee CEN/TC 290

Product Relations

Product life cycle