Standard

NS-EN ISO 17526:2003

Sept 2003 Published

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Abstract

ISO 17526:2003 covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers.It defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.

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Standard from SN
Published: 10 September 2003
Edition: 1
Version: 1
Document type: NAT
ISBN:

ICS 31.260
National Committee CEN/TC 123

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Refers: IEC 61703:2001 ED1
Refers: IEC 60050-191:1990 ED1
Adopted from: EN ISO 17526:2003 , 0

NS-EN ISO 17526:2003

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Abstract

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