Standard

NEK IEC PAS 62396-2:2007

Sept 2007 Withdrawn

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 2 468,00 Printed and bound Delivery time: 5-10 days kr 3 085,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Document information

Standard from NEK
Published: 18 September 2007
Withdrawn: 19 August 2008
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 03.100.50
ICS 31.020
ICS 49.060
National Committee NEK/NK107

Product Relations

Replaced by: NEK IEC 62396-2:2017
Adopted from: IEC 60794-1-1:2015 RLV
Adopted from: IEC 60794-1-1:2015 ED4
Replaced by: NEK IEC TS 62396-2:2008
Adopted from: IEC PAS 62396-2:2007

NEK IEC PAS 62396-2:2007

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Abstract

Document information

Product Relations

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Extended editions Extended editions (0)

Version history Related corrigendum and amendments (0)

Abstract

Document information

Product Relations