Standard

NEK IEC 62899-402-1:2017

Mar 2017 Withdrawn

Note: This standard has a new edition: NEK IEC 62899-402-1:2025

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Abstract

IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

Document information

Standard from NEK
Published: 3 March 2017
Withdrawn: 9 May 2025
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.180
National Committee TC 119

Product Relations

Replaced by: NEK IEC 62899-402-1:2025
Adopted from: IEC TS 61994-4-1:2018 RLV
Adopted from: IEC TS 61994-4-1:2018 ED3
Adopted from: IEC 62899-402-1:2017

NEK IEC 62899-402-1:2017

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NEK IEC 62899-402-1:2025