Standard

NEK IEC 62374:2007

Published

Corrigenda and amendments are bought separately.

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Abstract

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • ICS 31.080.99
  • National Committee NEK/NK47

Product Relations

  • Adopted from: IEC 62374:2007