Standard

NEK IEC 61967-6:2002

Jun 2002 Published

Note: This standard has a new edition: NEK IEC 61967-6:2002+A1:2008 CSV

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Language English

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Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method Published NEK IEC 61967-6:2002/COR1:2010 Corrigendum from Publication date: Aug 2010 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound
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Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method Published NEK IEC 61967-6:2002/AMD1:2008 Amendment from Publication date: Mar 2008 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.

Document information

Standard from NEK
Published: 25 June 2002
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.200
National Committee NEK/NK47

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Merged into: NEK IEC 61967-6:2002+A1:2008 CSV

NEK IEC 61967-6:2002

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