Standard

NEK IEC 61726:1999

Nov 1999 Withdrawn

Note: This standard has a new edition: NEK IEC 61726:2022

Corrigendums and amendments are bought separately.

Language English

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Abstract

Describes the measurement of screening attenuation by the reverberation, or stirred, chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring sreening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.

Document information

Standard from NEK
Published: 30 November 1999
Withdrawn: 8 September 2015
Edition: 2.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 33.120.10
ICS 33.120.30
National Committee NEK/NK46

Product Relations

Replaced by: NEK IEC 61726:2015
Replaced by: NEK IEC 61726:2015
Replaces: NEK IEC TR 61726:1995
Adopted from: IEC 61726:1999

NEK IEC 61726:1999

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