Standard

NEK IEC 61649:1997

May 1997 Withdrawn

Note: This standard has a new edition: NEK IEC 61649:2008

Corrigendums and amendments are bought separately.

Language English

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Abstract

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

Document information

Standard from NEK
Published: 16 May 1997
Withdrawn: 13 August 2008
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 03.120.01
ICS 03.120.30
National Committee NEK/NK56

Product Relations

Adopted from: IEC 61400-25-6:2016 ED2
Replaced by: NEK IEC 61649:2008
Adopted from: IEC 61649:1997

NEK IEC 61649:1997

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NEK IEC 61649:2008