Standard

NEK IEC 61163-2:1998

Nov 1998 Withdrawn

Note: This standard has a new edition: NEK IEC 61163-2:2020

Corrigendums and amendments are bought separately.

Language English

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Abstract

Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.

Document information

Standard from NEK
Published: 27 November 1998
Withdrawn: 11 March 2020
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 03.120.01
ICS 31.020
National Committee NEK/NK56

Product Relations

Replaced by: NEK IEC 61163-2:2020
Adopted from: IEC 62629-12-2:2019 ED1
Replaces: NEK IEC 60300-3-7:1999

NEK IEC 61163-2:1998

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NEK IEC 61163-2:2020