Standard

NEK IEC 60749:1984

Dec 1984 Withdrawn

Note: This standard has a new edition: NEK IEC 60749:1996+A1:2000+A2:2001 CSV

Preview External link

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 3 064,00 Printed and bound Delivery time: 5-10 days kr 3 829,00

There are no extended editions available for this standard

Open product
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods. Withdrawn NEK IEC 60749:1984/AMD2:1993 Amendment from Publication date: Sep 1993 Version: 1 Pages: 36 Language: English Services: Read Online (No printing ), Printed and bound
Open product
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods. Withdrawn NEK IEC 60749:1984/AMD1:1991 Amendment from Publication date: Dec 1991 Version: 1 Pages: 40 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Document information

Standard from NEK
Published: 30 December 1984
Withdrawn: 11 July 2011
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee TC 47

Product Relations

Adopted from: IEC 60335-2-13:2009+AMD1:2016 CSV
Adopted from: IEC 60335-2-13:2009 ED6
Replaced by: NEK IEC 60749:1996
Replaces: NEK IEC 60147-5A:1981
Replaces: NEK IEC 60147-5:1977

NEK IEC 60749:1984

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

NEK IEC 60749:1996+A1:2000+A2:2001 CSV

NEK IEC 60749:1996