Standard

NEK IEC 60747-5-3:1997

Sep 1997 Withdrawn

Note: This standard has a new edition: NEK IEC 60747-5-3:1997+A1:2002 CSV

Corrigendums and amendments are bought separately.

Language English

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Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods Withdrawn NEK IEC 60747-5-3:1997/A1:2002 Amendment from Publication date: Mar 2002 Version: 1 Pages: 32 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.