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Standard

NEK IEC 60747-14-3:2009

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Abstract

IEC 60747-14-3:2009 specifies requirements for semiconductor pressure sensors measuring absolute, gauge or differential pressures. The major technical change with regard to the previous edition is the addition of a new subclause 5.9 (measuring method of linearity). This publication should be read in conjunction with IE C 60747-1:2006.

Document information

  • Standard from NEK
  • Published:
  • Edition: 2.0
  • Version: 1
  • Document type: NAT
  • ICS 31.080.99
  • National Committee TC 47/SC 47E

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