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Standard

NEK IEC 60747-10:1991

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Abstract

It is a generic specification for semiconductor devices, discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for measuring methods of electrical characteristics, climatic and mechanical tests, and endurance tests.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 2.0
  • Version: 1
  • Document type: NAT
  • ICS 31.080.01
  • ICS 31.200
  • National Committee NEK/NK47

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