Standard

NEK IEC 60512-26-100:2008

Jul 2008 Published

Note: This standard has a new edition: NEK IEC 60512-26-100:2008+A1:2011 CSV

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Amendment 1 - Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g Published NEK IEC 60512-26-100:2008/AMD1:2011 Amendment from Publication date: Mar 2011 Version: 1 Pages: 16 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

IEC 60512-26-100:2008 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided: insertion loss, test 26a; return loss, test 26b; near-end crosstalk (NEXT), test 26c; far-end crosstalk (FEXT), test 26d; transfer impedance, test 26e; transverse conversion loss (TCL), test 26f; transverse conversion transfer loss (TCTL), test 26g. This publication is to be read in conjunction with IEC 60512-1:2001 and IEC 60512-1-100:2006.

Document information

Standard from NEK
Published: 21 July 2008
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.220.10
National Committee NEK/NK48

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Merged into: NEK IEC 60512-26-100:2008+A1:2011 CSV
Adopted from: IEC 60512-26-100:2008

NEK IEC 60512-26-100:2008

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