Standard

NEK EN 61788-15:2011

Jan 2012 Published

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Abstract

IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.

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Standard from NEK
Published: 1 January 2012
Edition: 2011-12
Version: 1
Document type: NAT
ISBN:

National Committee NEK/NK90
ICS 29.050

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Replaced by: NEK EN IEC 61788-15:2026
Refers: NEK EN 61788-7:2006
Refers: IEC 60050-815:2000 ED1
Adopted from: EN 61788-15:2011 , 0

NEK EN 61788-15:2011

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Abstract

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