Standard

JEDEC JESD24-4

Published

Note: This standard has a new edition: JEDEC JESD24-4

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Abstract

The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the base-emitter voltage is used as the junction temperature indicator. This test method is used to measure the thermal response of the junction to a heating pulse. Specifically, the test may be used to measure dc thermal resistance, and to ensure proper die mountdown to its case. This is accomplished through the appropriate choice of pulse duration and heating power magnitude.

Document information

  • Standard from JEDEC_AC
  • Published:
  • Version: 0
  • Document type: IS
  • Additional information
    • Addendum to JEDEC JESD 24