Standard

IEEE 1505.1

Aug 2019 Revised

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Standard

IEEE 1505.1
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Aug 2019 Revised
Standard

IEEE 1505.1
The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505™

Aug 2019 Published
Standard

IEEE 1505.1
Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Dec 2015 Revised

Abstract

The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications. Purpose Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. 1 Information on references can be found in Clause 2.

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Standard from IEEE_AC
Published: 20 August 2019
Version: 0
Document type: IS
ISBN:

IEEE 1505.1

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IEEE 1505.1

IEEE 1505.1

IEEE 1505.1

Abstract

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