Standard

IEC PAS 62396-5:2007 ED1

Sept 2007 Replaced

Corrigendums and amendments are bought separately.

Language English

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Abstract

Provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset in microelectronics.

Document information

Standard from IEC
Published: 18 September 2007
Withdrawn: 19 August 2008
Edition: 1
Version: 1
Document type: PAS
ISBN: 2831892066

ICS 03.100.50
ICS 31.020
ICS 49.060
ISO TC TC 107

Product Relations

Replaced by: IEC TS 62396-5:2008 ED1

Product life cycle

Current product

Replaced

IEC PAS 62396-5:2007 ED1
Stage 99.60
Replaced by

Replaced

IEC TS 62396-5:2008 ED1

IEC PAS 62396-5:2007 ED1

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Abstract

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Abstract

Document information

Product Relations

Product life cycle