Standard

IEC PAS 62206:2000 ED1

Nov 2000 Replaced

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Language English

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Abstract

Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.

Document information

Standard from IEC
Published: 28 November 2000
Withdrawn: 10 March 2004
Edition: 1
Version: 1
Document type: PAS
Pages
ISBN: 2831854822

ICS 31.080.01
ISO TC TC 47

Product Relations

Adopted by: NEK ISO/IEC 19772:2009
Replaced by: IEC 60749-34:2004 ED1

IEC PAS 62206:2000 ED1

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Abstract

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Abstract

Document information

Product Relations

Product life cycle