Standard

IEC PAS 62177:2000 ED1

Aug 2000 Replaced

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 336,00 Printed and bound Delivery time: 5-10 days kr 420,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

The highly-accelerated temperature and humidity stress test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Document information

Standard from IEC
Published: 24 August 2000
Withdrawn: 1 July 2002
Edition: 1
Version: 1
Document type: PAS
Pages
ISBN: 2831853508

ICS 31.080.01
ISO TC TC 47

Product Relations

Replaced by: IEC 60749-4:2002 ED1

IEC PAS 62177:2000 ED1

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Abstract

Document information

Product Relations

Product life cycle

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Extended editions Extended editions (0)

Version history Related corrigendum and amendments (0)

Abstract

Document information

Product Relations

Product life cycle