Standard

IEC 62899-402-1:2017 ED1

Mar 2017 Revised

Note: This standard has a new edition: IEC 62899-402-1:2025 ED2

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Abstract

IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

Document information

Standard from IEC
Published: 3 March 2017
Withdrawn: 9 May 2025
Edition: 1
Version: 1
Document type: IS
Pages
ISBN: 9782832239988

ICS 31.180
ISO TC TC 119

Product Relations

Revised by: IEC 62899-402-1:2025 ED2
Adopted by: NEK ISO/IEC TR 15443-3:2007
Adopted by: NEK IEC 61525:1996

IEC 62899-402-1:2017 ED1

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IEC 62899-402-1:2025 ED2