Standard

IEC 62433-2:2017 ED2

Jan 2017 Published

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Abstract

IEC 62433-2:2017 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE macro-model can also be used for modelling an IC-die, a functional block and an Intellectual Property (IP) block. The ICEM-CE macro-model can be used to model both digital and analogue ICs. This edition includes the following significant technical changes with respect to the previous edition: Incorporation of an XML based exchange format for model representation.

Document information

Standard from IEC
Published: 27 January 2017
Edition: 2
Version: 1
Document type: IS
ISBN:

ICS 31.200
ICS 33.100.10
ISO TC TC 47/SC 47A

Product Relations

Revises: IEC 62433-2:2008 ED1
FRANKFURT AGREEMENT: FprEN 62433-2:2016

Product life cycle

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Revised

IEC 62433-2:2008 ED1
Current product

Published

IEC 62433-2:2017 ED2
Stage 60.60

IEC 62433-2:2017 ED2

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