Standard

IEC 62153-4-7:2006 ED1

Apr 2006 Revised

Note: This standard has a new edition: IEC 62153-4-7:2021+AMD1:2025 CSV

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Language English/French

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Abstract

is suitable to determine the surface transfer impedance and/or screening attenuation and coupling attenuation of mated screened connectors (including the connection between cable and connector) and cable assemblies. This method could also be extended to determine the transfer impedance, coupling or screening attenuation of balanced or multipin connectors and cable assemblies.

Document information

Standard from IEC
Published: 21 April 2006
Withdrawn: 9 December 2015
Edition: 1
Version: 1
Document type: IS
ISBN: 2831886082

ICS 33.100.10
ICS 33.120.10
ISO TC TC 46

Product Relations

Revised by: IEC 62153-4-7:2015+AMD1:2018 CSV
Revised by: IEC 62153-4-7:2015 ED2
Adopted by: NEK IEC 60238:1996

Product life cycle

Current product

Revised

IEC 62153-4-7:2006 ED1
Stage 99.60
Revised by

Revised

IEC 62153-4-7:2015+AMD1:2018 CSV

Revised

IEC 62153-4-7:2015 ED2

IEC 62153-4-7:2006 ED1

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IEC 62153-4-7:2021+AMD1:2025 CSV

IEC 62153-4-7:2021 ED3

IEC 62153-4-7:2015+AMD1:2018 CSV

IEC 62153-4-7:2015 ED2