Consolidated

IEC 62007-2:1997+AMD1:1998 CSV

Feb 1999 Revised

Note: This standard has a new edition: IEC 62007-2:2025 ED3

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (1998). Therefore, no need to order amendment in addition to this publication.

Document information

Consolidated from IEC
Published: 26 February 1999
Withdrawn: 26 January 2009
Edition: 1.1
Version: 1
Document type: IS
ISBN: 2831846056

ICS 31.080.01
ICS 31.260
ICS 33.180.01
ISO TC TC 86/SC 86C

Product Relations

Revised by: IEC 62007-2:2009 ED2

Product life cycle

Current product

Revised

IEC 62007-2:1997+AMD1:1998 CSV
Revised by

Revised

IEC 62007-2:2009 ED2

IEC 62007-2:1997+AMD1:1998 CSV

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IEC 62007-2:2025 ED3

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