Standard

IEC 61788-3:2000 ED1

Dec 2000 Revised

Note: This standard has a new edition: IEC 61788-3:2006 ED2

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Language English

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Abstract

Covers a test method for the determination of the d.c. critical current of short and straight Ag- or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides.

Document information

Standard from IEC
Published: 14 December 2000
Withdrawn: 27 April 2006
Edition: 1
Version: 1
Document type: IS
ISBN: 2831855403

ICS 17.220.20
ICS 29.050
ISO TC TC 90

Product Relations

Revised by: IEC 61788-3:2006 ED2

Product life cycle

Current product

Revised

IEC 61788-3:2000 ED1
Stage 99.60
Revised by

Published

IEC 61788-3:2006 ED2

IEC 61788-3:2000 ED1

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IEC 61788-3:2006 ED2