Standard

IEC 61788-15:2011 ED1

Oct 2011 Revised

Note: This standard has a new edition: IEC 61788-15:2026

Corrigendums and amendments are bought separately.

Language English English/French

Services Read Online (No printing ) kr 3 995,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.

Document information

Standard from IEC
Published: 24 October 2011
Withdrawn: 23 March 2026
Edition: 1
Version: 1
Document type: IS
ISBN:

ICS 17.220.20
ICS 29.050
ISO TC TC 90

Product Relations

Revised by: IEC 61788-15:2026 RLV
Revised by: IEC 61788-15:2026
Adopted by: NEK IEC 60432:1984

Product life cycle

Current product

Revised

IEC 61788-15:2011 ED1
Stage 99.60
Revised by

Published

IEC 61788-15:2026 RLV

Published

IEC 61788-15:2026

IEC 61788-15:2011 ED1

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

IEC 61788-15:2026