Standard

IEC 61672-2:2003 ED1

Apr 2003 Revised

Note: This standard has a new edition: IEC 61672-2:2013+AMD1:2017 CSV

Corrigendums and amendments are bought separately.

Language English English/French

Services Read Online (No printing ) kr 3 569,00 Printed and bound Delivery time: 5-10 days kr 4 461,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

Provides details of the tests necessary to verify conformance to all mandatory specifications given in IEC 61672-1:2002 for conventional sound level meters, integrating-averaging sound level meters and integrating sound level meters. Pattern evaluation tests apply for each channel of a multi-channel sound level meter, as appropriate. Tests and test methods are applicable to class 1 and class 2 sound level meters. The aim is to ensure that all testing laboratories use consistent methods to perform pattern evaluation tests.

Document information

Standard from IEC
Published: 16 April 2003
Withdrawn: 30 September 2013
Edition: 1
Version: 1
Document type: IS
Pages
ISBN:

ICS 17.140.50
ISO TC TC 29

Product Relations

Revised by: IEC 61672-2:2013+AMD1:2017 CSV
Revised by: IEC 61672-2:2013 ED2
Replaces: IEC 60651:1979+AMD1:1993+AMD2:2000 CSV
Replaces: IEC 60804:2000 ED2
Replaces: IEC 60651:1979 ED1

IEC 61672-2:2003 ED1

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

IEC 61672-2:2013+AMD1:2017 CSV

IEC 61672-2:2013 ED2