Standard

IEC 61649:1997 ED1

May 1997 Revised

Note: This standard has a new edition: IEC 61649:2008 ED2

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

Document information

Standard from IEC
Published: 16 May 1997
Withdrawn: 13 August 2008
Edition: 1
Version: 1
Document type: IS
ISBN: 2831838371

ICS 03.120.01
ICS 03.120.30
ISO TC TC 56

Product Relations

Revised by: IEC 61649:2008 ED2

Product life cycle

Current product

Revised

IEC 61649:1997 ED1
Stage 99.60
Revised by

Published

IEC 61649:2008 ED2

IEC 61649:1997 ED1

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IEC 61649:2008 ED2