Standard

IEC 61163-2:1998 ED1

Nov 1998 Revised

Note: This standard has a new edition: IEC 61163-2:2020 ED2

Corrigendums and amendments are bought separately.

Language English English/French

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Abstract

Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.

Document information

Standard from IEC
Published: 27 November 1998
Withdrawn: 11 March 2020
Edition: 1
Version: 1
Document type: IS
Pages
ISBN:

ICS 03.120.01
ICS 31.020
ISO TC TC 56

Product Relations

Revised by: IEC 61163-2:2020 ED2
Partially replaces: IEC 60300-3-7:1999 ED1

IEC 61163-2:1998 ED1

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IEC 61163-2:2020 ED2