Standard

IEC 61000-4-24:1997 ED1

Feb 1997 Revised

Note: This standard has a new edition: IEC 61000-4-24:2015+AMD1:2023 CSV

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Language English/French

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Abstract

Deals with methods for testing protective devices for HEMP conducted disturbance. It primarily covers testing of voltage breakdown and voltage-limiting characteristics but also methods to measure the residual voltage under HEMP conditions for the case of very fast changes of voltage (u) and current (i) as a function of time.

Document information

Standard from IEC
Published: 28 February 1997
Withdrawn: 5 November 2015
Edition: 1
Version: 1
Document type: IS
Pages
ISBN: 2831837383

ICS 33.100.01
ISO TC TC 77/SC 77C

Product Relations

Revised by: IEC 61000-4-24:2015+AMD1:2023 CSV
Revised by: IEC 61000-4-24:2015 ED2

IEC 61000-4-24:1997 ED1

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IEC 61000-4-24:2015+AMD1:2023 CSV

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