Standard

IEC 61000-4-16:1998 ED1

Jan 1998 Revised

Note: This standard has a new edition: IEC 61000-4-16:2015 ED2

Preview External link

Corrigendums and amendments are bought separately.

Language English/French

Services Read Online (No printing ) kr 2 338,00 Printed and bound Delivery time: 5-10 days kr 2 922,00

There are no extended editions available for this standard

Open product
Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz Revised IEC 61000-4-16:1998/AMD2:2009 ED1 Amendment from Publication date: Jul 2009 Version: 1 Pages: 8 Language: English/French Services: Read Online (No printing ), Printed and bound
Open product
Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz Revised IEC 61000-4-16:1998/AMD1:2001 ED1 Amendment from Publication date: Jul 2001 Version: 1 Pages: 5 Language: English/French Services: Read Online (No printing ), Printed and bound

Abstract

Establishes a common and reproducible basis for testing electrical and electronic equipment with the application of common mode disturbances to power supply, control, signal and communication ports. This standard defines test voltage and current waveform, range of test levels, test equipment, test set-up and test procedures. The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to conducted, common mode disturbances such as those originating from power line currents and return leakage currents in the earthing/grounding system.

Document information

Standard from IEC
Published: 30 January 1998
Withdrawn: 9 December 2015
Edition: 1
Version: 1
Document type: IS
Pages
ISBN: 2831841623

ICS 33.100.20
ISO TC TC 77/SC 77A

Product Relations

Revised by: IEC 61000-4-16:2015 RLV
Revised by: IEC 61000-4-16:2015 ED2
Adopted by: NEK IEC 62271-100:2008

IEC 61000-4-16:1998 ED1

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

IEC 61000-4-16:2015 ED2

IEC 61000-4-16:1998+AMD1:2001+AMD2:2009 CSV

IEC 61000-4-16:1998+AMD1:2001 CSV